Analog Statistical Design for Manufacturability Using Linear and Nonlinear Response. - Yu-shan Wang (IEEE Access, 2019)

10.7 A 64GS/s 4×-Interpolated 1b Semi-Digital FIR DAC for Wideband Calibration and BIST of RF-Sampling A/D Converters. - Martin Clara; Daniel Gruber; Albert Molina; Matteo Camponeschi; Yu-shan Wang; Christian Lindholm; Hundo Shin; Ramón Sanchez-Perez; Christoph Duller; Patrick Torta; Kamran Azadet (ISSCC, 2021)

10.6 A 12b 16GS/s RF-Sampling Capacitive DAC for Multi-Band Soft-Radio Base-Station Applications with On-Chip Transmission-Line Matching Network in 16nm FinFET. - Daniel Gruber; Martin Clara; Ramón Sanchez-Perez; Yu-shan Wang; Christoph Duller; Gerald Rauter; Patrick Torta; Kamran Azadet (ISSCC, 2021)

A 12-b 16-GS/s RF-Sampling Capacitive DAC for Multi-Band Soft Radio Base-Station Applications With On-Chip Transmission-Line Matching Network in 16-nm FinFET. - Daniel Gruber; Martin Clara; Ramón Sanchez-Perez; Yu-shan Wang; Christoph Duller; Gerald Rauter; Patrick Torta; Gerhard Knoblinger; Kamran Azadet (IEEE J. Solid State Circuits, 2021)