A new morphology-based approach for similarity searching on wafer bin maps in semiconductor manufacturing. - Tsung-Jung Hsieh; Chung-Shou Liao; Yu-Syuan Huang; Chen-Fu Chien 001 (CSCWD, 2012)

Similarity Searching for Defective Wafer Bin Maps in Semiconductor Manufacturing. - Chung-Shou Liao; Tsung-Jung Hsieh; Yu-Syuan Huang; Chen-Fu Chien 001 (IEEE Trans Autom. Sci. Eng., 2014)

Indoor VLC System With Multiple LEDs of Different Path Lengths Employing Space-Time Block-Coded DMT/CAP Modulation [Invited]. - Chia-Chien Wei; Fang-Ming Wu; Zhen-Yu Chen 003; Chun-Ting Lin; Yu-Syuan Huang; Yung-Jui Chen; Sien Chi (JOCN, 2015)