Start-Up Demonstration Tests With the Intent of Equipment Classification for Balanced Systems. - Xian Zhao; Xiaoyue Wang 001; David W. Coit; Yuan Chen 005 (IEEE Trans. Reliab., 2019)

Two-level differential burn-in policy for spatially heterogeneous defect units in semiconductor manufacturing. - Yuan Chen 005; Tao Yuan; Suk Joo Bae; Yue Kuo (Comput. Ind. Eng., 2021)

A condition-based inspection-maintenance policy for critical systems with an unreliable monitor system. - Xian Zhao; Bin Guo; Yuan Chen 005 (Reliab. Eng. Syst. Saf., 2024)