A Simulator for At-Speed Robust Testing of Path Delay Faults in Combinational Circuits. - Yuan-Chieh Hsu; Sandeep K. Gupta 001 (IEEE Trans. Computers, 1996)

An Automatic Test Pattern Generator for At-Speed Robust Path Delay Testing. - Yuan-Chieh Hsu; Sandeep K. Gupta 001 (Asian Test Symposium, 1998)

A new path-oriented effect-cause methodology to diagnose delay failures. - Yuan-Chieh Hsu; Sandeep K. Gupta 001 (ITC, 1998)

Path delay fault diagnosis in combinational circuits with implicitfault enumeration. - Pankaj Pant; Yuan-Chieh Hsu; Sandeep K. Gupta 001; Abhijit Chatterjee (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2001)