Charge Loss Induced by Defects of Transition Layer in Charge-Trap 3D NAND Flash Memory. - Fei Wang 122; Yuan Li 079; Xiaolei Ma; Jiezhi Chen (IEEE Access, 2021)

Flash memory based computing-in-memory system to solve partial differential equations. - Yang Feng; Fei Wang 122; Xuepeng Zhan; Yuan Li 079; Jiezhi Chen (Sci. China Inf. Sci., 2021)