Diagnosis with Limited Failure Information. - Yu Huang 005; Wu-Tung Cheng; Nagesh Tamarapalli; Janusz Rajski; Randy Klingenberg; Will Hsu; Yuan-Shih Chen (ITC, 2006)

Diagnose compound scan chain and system logic defects. - Yu Huang 005; Wu-Tung Cheng; Ruifeng Guo; Will Hsu; Yuan-Shih Chen; Albert Mann (ITC, 2007)

Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns. - Yu Huang 005; Wu-Tung Cheng; Ruifeng Guo; Ting-Pu Tai; Feng-Ming Kuo; Yuan-Shih Chen (Asian Test Symposium, 2009)

Yield Ramp up by Scan Chain Diagnosis. - Feng-Ming Kuo; Yuan-Shih Chen (Asian Test Symposium, 2009)

Case study of scan chain diagnosis and PFA on a low yield wafer. - Yu Huang 005; Brady Benware; Wu-Tung Cheng; Ting-Pu Tai; Feng-Ming Kuo; Yuan-Shih Chen (ITC, 2010)