Syndrome Simulation And Syndrome Test For Unscanned Interconnects. - Chauchin Su; Shyh-Shen Hwang; Shyh-Jye Jou; Yuan-Tzu Ting (Asian Test Symposium, 1996)

A Practical Implementation Of Dynamic Testing Of An Ad Converter. - Yuan-Tzu Ting; Li Wei Chao; Wei Chung Chao (Asian Test Symposium, 1996)

Decentralized BIST for 1149.1 and 1149.5 Based Interconnects. - Chauchin Su; Shyh-Jye Jou; Yuan-Tzu Ting (ED&TC, 1996)

Metrology for analog module testing using analog testability bus. - Chauchin Su; Yue-Tsang Chen; Shyh-Jye Jou; Yuan-Tzu Ting (ICCAD, 1996)