Yuan Zhou

Orcid: 0000-0002-7148-9056

Affiliations:
  • University of Texas at Dallas, Department of Electrical and Computer Engineering, Richardson, TX, USA


According to our database1, Yuan Zhou authored at least 12 papers between 2013 and 2019.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

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Bibliography

2019
A 12-b 1-GS/s 31.5-mW Time-Interleaved SAR ADC With Analog HPF-Assisted Skew Calibration and Randomly Sampling Reference ADC.
IEEE J. Solid State Circuits, 2019

A 78.5-dB SNDR Radiation- and Metastability-Tolerant Two-Step Split SAR ADC Operating Up to 75 MS/s With 24.9-mW Power Consumption in 65-nm CMOS.
IEEE J. Solid State Circuits, 2019

2018
A 9-bit 215 MS/s Folding-Flash Time-to-Digital Converter Based on Redundant Remainder Number System in 45-nm CMOS.
IEEE J. Solid State Circuits, 2018

2017
A 23-mW 24-GS/s 6-bit Voltage-Time Hybrid Time-Interleaved ADC in 28-nm CMOS.
IEEE J. Solid State Circuits, 2017

28.6 A 78.5dB-SNDR radiation- and metastability-tolerant two-step split SAR ADC operating up to 75MS/s with 24.9mW power consumption in 65nm CMOS.
Proceedings of the 2017 IEEE International Solid-State Circuits Conference, 2017

2016
A 23mW 24GS/s 6b Time-interleaved hybrid two-step ADC in 28nm CMOS.
Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016

2015
PN-Assisted Deterministic Digital Background Calibration of Multistage Split-Pipelined ADC.
IEEE Trans. Circuits Syst. I Regul. Pap., 2015

A 12 bit 160 MS/s Two-Step SAR ADC With Background Bit-Weight Calibration Using a Time-Domain Proximity Detector.
IEEE J. Solid State Circuits, 2015

2014
A 12b 160MS/s synchronous two-step SAR ADC achieving 20.7fJ/step FoM with opportunistic digital background calibration.
Proceedings of the Symposium on VLSI Circuits, 2014

PN-assisted deterministic digital calibration of split two-step ADC to over 14-bit accuracy.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

A 9-bit 215-MS/s folding-flash time-to-digital converter based on redundant remainder number system.
Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014

2013
Digital calibration of inter-stage nonlinear errors in pipelined SAR ADC.
Proceedings of the IEEE 56th International Midwest Symposium on Circuits and Systems, 2013


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