Efficient BISR Techniques for Embedded Memories Considering Cluster Faults. - Chun-Lin Yang; Yuang-Cheng Hsiao; Shyue-Kung Lu (PRDC, 2007)

Low-Power Built-In Self-Test Techniques for Embedded SRAMs. - Shyue-Kung Lu; Yuang-Cheng Hsiao; Chia-Hsiu Liu; Chun-Lin Yang (VLSI Design, 2007)

Efficient BISR Techniques for Embedded Memories Considering Cluster Faults. - Shyue-Kung Lu; Chun-Lin Yang; Yuang-Cheng Hsiao; Cheng-Wen Wu (IEEE Trans. Very Large Scale Integr. Syst., 2010)