Early prediction of merged code changes to prioritize reviewing tasks. - Yuanrui Fan; Xin Xia 001; David Lo 001; Shanping Li (Empir. Softw. Eng., 2018)

Deep Learning Based Valid Bug Reports Determination and Explanation. - Jianjun He; Ling Xu; Yuanrui Fan; Zhou Xu 003; Meng Yan 001; Yan Lei (ISSRE, 2020)

JITO: a tool for just-in-time defect identification and localization. - Fangcheng Qiu; Meng Yan 001; Xin Xia 001; Xinyu Wang 001; Yuanrui Fan; Ahmed E. Hassan; David Lo 001 (ESEC/SIGSOFT FSE, 2020)

Effort-aware just-in-time defect identification in practice: a case study at Alibaba. - Meng Yan 001; Xin Xia 001; Yuanrui Fan; David Lo 001; Ahmed E. Hassan; Xindong Zhang (ESEC/SIGSOFT FSE, 2020)

Chaff from the Wheat: Characterizing and Determining Valid Bug Reports. - Yuanrui Fan; Xin Xia 001; David Lo 001; Ahmed E. Hassan (IEEE Trans. Software Eng., 2020)

A Differential Testing Approach for Evaluating Abstract Syntax Tree Mapping Algorithms. - Yuanrui Fan; Xin Xia 001; David Lo 001; Ahmed E. Hassan; Yuan Wang 008; Shanping Li (ICSE, 2021)

What makes a popular academic AI repository? - Yuanrui Fan; Xin Xia 001; David Lo 001; Ahmed E. Hassan; Shanping Li (Empir. Softw. Eng., 2021)

The Impact of Mislabeled Changes by SZZ on Just-in-Time Defect Prediction. - Yuanrui Fan; Xin Xia 001; Daniel Alencar da Costa; David Lo 001; Ahmed E. Hassan; Shanping Li (IEEE Trans. Software Eng., 2021)

The Impact of Duplicate Changes on Just-in-Time Defect Prediction. - Ruifeng Duan 002; Haitao Xu 001; Yuanrui Fan; Meng Yan 001 (IEEE Trans. Reliab., 2022)

Just-In-Time Defect Identification and Localization: A Two-Phase Framework. - Meng Yan 001; Xin Xia 001; Yuanrui Fan; Ahmed E. Hassan; David Lo 001; Shanping Li (IEEE Trans. Software Eng., 2022)