An Intelligent Factory Automation System With Multivariate Time Series Algorithm for Chip Probing Process. - Yu-Ming Hsieh; Chin-Yi Lin; Jan Wilch; Birgit Vogel-Heuser; Yu-Chen Lin 005; Yu-Chuan Lin; Min-Hsiung Hung; Fan-Tien Cheng (IEEE Robotics Autom. Lett., 2023)