Feature Detection and Hypothesis Testing for Extremely Noisy Nanoparticle Images using Topological Data Analysis. - Andrew M. Thomas; Peter A. Crozier; Yuchen Xu 007; David S. Matteson (Technometrics, 2023)

Dynamic Atomic Column Detection in Transmission Electron Microscopy Videos via Ridge Estimation. - Yuchen Xu 007; Andrew M. Thomas; Peter A. Crozier; David S. Matteson (IEEE Trans. Image Process., 2025)