Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests. - Yi-Jun Lu; Ziquan Guo; Tien-Mo Shih; Yulin Gao; Wei-Lin Huang; Hong-Li Lu; Yue Lin 007; Zhong Chen 005 (IEEE Trans. Reliab., 2016)

Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array. - Lili Zheng; Ziquan Guo; Wei Yan; Yue Lin 007; Yi-Jun Lu; Hao-Chung Kuo; Zhong Chen 005; Lihong Zhu; Tingzhu Wu; Yulin Gao (IEEE Access, 2018)

Remote Online Two-Step Stress Lifetime Acceleration Test System for Ultraviolet Light-Emitting Diodes. - Lihong Zhu; Qiu-Wei Zheng; Yu-Jiao Ruan; Wei-Jie Guo 001; Yulin Gao; Ziquan Guo; Yue Lin 007; Tingzhu Wu; Zhong Chen 005; Yi-Jun Lu (IEEE Trans. Instrum. Meas., 2021)

A Deep Learning-Aided Remote Spectrally Tunable LED Light Source Integrated System. - Renzhu Zhang; Ziquan Guo; Yayong Chen; Yu-Jiao Ruan; Lihong Zhu; Guolong Chen; Yue Lin 007; Weijie Guo 001; Tingzhu Wu; Yuhan Su; Zhong Chen 005; Yijun Lu (IEEE Trans. Instrum. Meas., 2023)

A Noncontact Photoelectric Joint Detection Method for Mini-LEDs Based on the Photovoltaic Effect. - Chenming Zhong; Weijie Guo 001; Lihong Zhu; Guolong Chen; Xiao Yang; Xiaotong Fan; Yue Lin 007; Zhong Chen 005; Yijun Lu (IEEE Trans. Ind. Electron., 2024)

Active Autofocusing Method With Plane Tilt Correction for AR Microdisplay Inspection. - Chenming Zhong; Yue Lin 007; Guo-Long Chen; Lihong Zhu; Yi-Jun Lu; Zhong Chen 005; Weijie Guo 001 (IEEE Trans. Instrum. Meas., 2025)