Micro-Vision Super-Resolution Restoration and Positioning Based on Ultraprecision Machining Topography Guidance. - Zijian Zhu; Chenyang Zhao 001; Yueping Xi (IEEE Trans. Instrum. Meas., 2024)

An Investigation of the Planar 3-DOF Nanoscale Positioning Measurement Method Based on Cross-Encoded Pattern. - Weien Yu; Zijian Zhu; Chenyang Zhao 001; Yueping Xi; Yang Yang; Qiaozhi Lei (IEEE Trans. Instrum. Meas., 2025)

Microscale 3-D Rotation Estimation Based on Deflected Defocused Feature Extraction. - Zijian Zhu; Qinghong Wan; Yingxue Yao; Yueping Xi; Chenyang Zhao 001 (IEEE Trans. Instrum. Meas., 2025)

Influence Mechanism of the Surface Topography on the Positioning Measurement Accuracy of Micro-Vision Pattern Targets. - Zijian Zhu; Chenyang Zhao 001; Yang Yang; Yueping Xi (IEEE Trans. Instrum. Meas., 2025)