A Novel Approach to the Analysis of VLSI Device Test Programs. - Yuhai Ma; Wanchun Shi (ITC, 1996)

OLDEVDTP: A Novel Environment for Off-Line Debugging of VLSI Device Test Programs. - Yuhai Ma; Wanchun Shi (ITC, 1997)

Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs. - Yuhai Ma; Wanchun Shi (J. Electron. Test., 1999)

A Full Digital Fractional-N TAF-FLL for Digital Applications: Demonstration of the Principle of a Frequency-Locked Loop Built on Time-Average-Frequency. - Liming Xiu; Xiangye Wei; Yuhai Ma (IEEE Trans. Very Large Scale Integr. Syst., 2019)