Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons. - Kazusa Takami; Yuibi Gomi; Shin-ichiro Abe; Wang Liao; Seiya Manabe; Tetsuro Matsumoto; Masanori Hashimoto (IRPS, 2023)

ML-assisted SRAM Soft Error Rate Characterization: Opportunities and Challenges. - Masanori Hashimoto; Ryuichi Yasuda; Kazusa Takami; Yuibi Gomi; Kozo Takeuchi (ASP-DAC, 2025)

A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement. - Yuibi Gomi; Akira Sato; Waleed Madany; Kenichi Okada; Satoshi Adachi; Masatoshi Itoh; Masanori Hashimoto (CoRR, 2025)