Hydrogen passivation effects under negative bias temperature instability stress in metal/silicon-oxide/silicon-nitride/silicon-oxide/silicon capacitors for flash memories. - Hee-Dong Kim; Ho-Myoung An; Yujeong Seo; Yongjie Zhang; Jongsun Park 001; Tae Geun Kim (Microelectron. Reliab., 2010)

Process Improvements for 7th Generation 1Tb Quad-Level Cell 3D NAND Flash Memory in Mass Production. - Soochan Chung; Dong-Hyeon Ko; Joonsung Lim; Kyungmoon Kim; Sejie Takaki; Yujeong Seo; Byoungil Lee; Sejun Park; Jaeduk Lee; Kyungyoon Noh; Sujin Ahn; Sunghoi Hur (IMW, 2023)

High Bit Cost Scalability and Reliable Cell Characteristics for 7th Generation 1Tb 4Bit/Cell 3D-NAND Flash. - Kyungmoon Kim; Yujeong Seo; Sejun Park; Woojae Jang; Dongho Yoo; Joonsung Lim; Il-Han Park; Jaeduk Lee; Kyungyoon Noh; Sujin Ahn; Sunghoi Hur (VLSI Technology and Circuits, 2023)

Design with data-driven shape rule recognition through learning-based shape grammar interpreter - Yujeong Seo (2024)

Development of Innovative Self-Aligned SSL Mold (SASM) Scheme with Remarkable Reduction of Chip Size. - Junyoung Lee; Minkyu Jeong; Sejun Park; Joonam Kim; Joonghyeob Shin; Jongyoon Choi; Jihoon Choi; Byungsoo Kim; Yujeong Seo; Gilsung Lee; Dongsik Lee; Joon Kim; et al. (IMW, 2025)