Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. - Xiaoqing Wen; Kohei Miyase; Tatsuya Suzuki; Seiji Kajihara; Yuji Ohsumi; Kewal K. Saluja (DAC, 2007)

A novel scheme to reduce power supply noise for high-quality at-speed scan testing. - Xiaoqing Wen; Kohei Miyase; Seiji Kajihara; Tatsuya Suzuki; Yuta Yamato; Patrick Girard 001; Yuji Ohsumi; Laung-Terng Wang (ITC, 2007)