Volumetric description of dip solder joints from range data. - Yuji Takagi; Gérard G. Medioni (WACV, 1998)

Practical Pattern Detection from Distributed Defect Points on a Semiconductor Wafer. - Hisae Shibuya; Yuji Takagi (MVA, 2002)

Successive pattern classification based on test feature classifier and its application to defect image classification. - Yukinobu Sakata; Shun'ichi Kaneko; Yuji Takagi; Hirohito Okuda (Pattern Recognit., 2005)

Efficient Training for Automatic Defect Classification by Image Augmentation. - Naoaki Kondo; Minoru Harada; Yuji Takagi (WACV, 2018)