Charge state evaluation of passivation layers for silicon solar cells by scanning nonlinear dielectric microscopy. - Kento Kakikawa; Yuji Yamagishi; Yasuo Cho; Katsuto Tanahashi; Hidetaka Takato (IRPS, 2018)

High resolution observation of defects at SiO2/4H-SiC interfaces using time-resolved scanning nonlinear dielectric microscopy. - Yuji Yamagishi; Yasuo Cho (Microelectron. Reliab., 2018)

High Resolution Observation of Subsurface Defects at SiO2/4H-SiC Interfaces by Local Deep Level Transient Spectroscopy Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy. - Yuji Yamagishi; Yasuo Cho (IRPS, 2019)