Thin Film Magnetic Head Wafer Inspection Technique Using Geometrical Feature Based Image Comparison. - Atsushi Shimoda; Hisafumi Iwata; Yukihiro Shibata; Hidehiro Ikeda (MVA, 1998)

Minimization of L2-Sensitivity for 2-D Separable-Denominator State-Space Digital Filters Subject to L2-Scaling Constraints. - Takao Hinamoto; Yukihiro Shibata; Wu-Sheng Lu (APCCAS, 2006)

Minimization of L2-sensitivity for L2-D separable-denominator state-space digital filters subject to L2-scaling constraints using a lagrange function and a bisection method. - Takao Hinamoto; Yukihiro Shibata; Masayoshi Nakamoto (ICINCO-SPSMC, 2007)