Critical charge dependence of correlation of different neutron sources for soft error testing. - Hiroko Mori; Taiki Uemura; Hideya Matsuyama; Shin-ichiro Abe; Yukinobu Watanabe (IRPS, 2015)

Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs. - Wang Liao; Masanori Hashimoto; Seiya Manabe; Yukinobu Watanabe; Shin-ichiro Abe; Keita Nakano; Hayato Takeshita; Motonobu Tampo; Soshi Takeshita; Yasuhiro Miyake (IRPS, 2019)

Characterizing SRAM and FF soft error rates with measurement and simulation. - Masanori Hashimoto; Kazutoshi Kobayashi; Jun Furuta; Shin-ichiro Abe; Yukinobu Watanabe (Integr., 2019)

Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets. - Shin-ichiro Abe; Tatsuhiko Sato; Junya Kuroda; Seiya Manabe; Yukinobu Watanabe; Wang Liao; Kojiro Ito; Masanori Hashimoto; Masahide Harada; Kenichi Oikawa; Yasuhiro Miyake (IRPS, 2020)