Precise Visual Inspection Algorithm for LSI Wafer Patterns Using Grayscale Image Comparison. - Yukio Matsuyama; Hisafumi Iwata; Hitoshi Kubota; Yasuo Nakagawa (MVA, 1988)

Precise Visual Inspection of LSI Wafer Patterns by Local Perturbation Pattern Matching Algorithm. - Yukio Matsuyama; Hisafumi Iwata; Hitoshi Kubota; Yasuo Nakagawa (Syst. Comput. Jpn., 1990)

Automated Visual Inspection Algorithm for Solder Joint of Surface Mount Devices Based on Three Dimensional Shape Analysis. - Toshifumi Honda; Yukio Matsuyama; Hisae Yamamura; Hideaki Sasazawa; Takanori Ninomiya; Ludwig Listl; Anton Schick; Richard Schneider (MVA, 1996)

Automated solder joint inspection system using optical 3-D image detection. - Yukio Matsuyama; Toshifumi Honda; Hisae Yamamura; Hideaki Sasazawa; Mineo Nomoto; Takanori Ninomiya; Anton Schick; Ludwig Listl; Paul Köllensperger; Dieter Spriegel; Peter Mengel; Richard Schneider (WACV, 1996)

Robust parameter tuning method of LW-PLS and verification of its effectiveness by twelve industrial processes. - Yukio Matsuyama; Sanghong Kim; Shinji Hasebe (Comput. Chem. Eng., 2021)