4.5 A 16nm FinFET heterogeneous nona-core SoC complying with ISO26262 ASIL-B: Achieving 10-7 random hardware failures per hour reliability. - Chikafumi Takahashi; Shinichi Shibahara; Kazuki Fukuoka; Jun Matsushima; Yuko Kitaji; Yasuhisa Shimazaki; Hirotaka Hara; Takahiro Irita (ISSCC, 2016)

A 16 nm FinFET Heterogeneous Nona-Core SoC Supporting ISO26262 ASIL B Standard. - Shinichi Shibahara; Chikafumi Takahashi; Kazuki Fukuoka; Yuko Kitaji; Takahiro Irita; Hirotaka Hara; Yasuhisa Shimazaki; Jun Matsushima (IEEE J. Solid State Circuits, 2017)

A 28nm fully digital voltage monitor with 16.5uV/°C accuracy and 0.8mV quantized error from -40 to 160°C for ISO26262 ASIL-D capable MCU. - Toshifumi Uemura; Yuko Kitaji; Kazuki Fukuoka (A-SSCC, 2019)