Mesoscopic modeling of silver particles melting process on silicon wafer in inkjet-printed solar cell metallization. - Lei Zhang; Enjian Yang; Yulin Miao (Comput. Math. Appl., 2024)

Multibranched Dilated Convolution With Feature Fusion and Dropout for Accurate Wafer Surface Defect Detection. - Guang Yang 045; Zhijia Yang; Junzhang Pan; Yulin Miao; Shuping Cui (IEEE Trans. Instrum. Meas., 2025)