Sensitive Region-Based Metamorphic Testing Framework using Explainable AI. - Yuma Torikoshi; Yasuharu Nishi; Juichi Takahashi (MET, 2023)

Semantic Metamorphic Testing focusing on Object Rarity. - Yasuharu Nishi; Hidenori Ito; Yuma Torikoshi (ICSTW, 2023)