An on Chip ADC Test Structure. - Yun-Che Wen; Kuen-Jong Lee (DATE, 2000)

Analysis and generation of control and observation structures foranalog circuits. - Yun-Che Wen; Kuen-Jong Lee (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2001)

A BIST Scheme for Testing Analog-to-Digital Converters with Digital Response Analyses. - Yun-Che Wen (VTS, 2005)

Test scheme for switched-capacitor circuits by digital analyses. - Yun-Che Wen (DDECS, 2009)