Reducing aging on scratchpad memory using temporal- and FSM-based power management. - Yun Kae Law; Ing-Chao Lin; Cheng-Chien Lin (VLSI-DAT, 2017)

Mitigating BTI-Induced Degradation in STT-MRAM Sensing Schemes. - Ing-Chao Lin; Yun Kae Law; Yuan Xie 001 (IEEE Trans. Very Large Scale Integr. Syst., 2018)