The effects of test compaction on fault diagnosis. - Yun Shao 002; Ruifeng Guo; Sudhakar M. Reddy; Irith Pomeranz (ITC, 1999)

An Efficient Method to Identify Untestable Path Delay Faults. - Yun Shao 002; Sudhakar M. Reddy; Seiji Kajihara; Irith Pomeranz (Asian Test Symposium, 2001)

On Generating High Quality Tests for Transition Faults. - Yun Shao 002; Irith Pomeranz; Sudhakar M. Reddy (Asian Test Symposium, 2002)

Path Delay Fault Test Generation for Standard Scan Designs Using State Tuples. - Yun Shao 002; Irith Pomeranz; Sudhakar M. Reddy (ASP-DAC/VLSI Design, 2002)

On Selecting Testable Paths in Scan Designs. - Yun Shao 002; Sudhakar M. Reddy; Irith Pomeranz; Seiji Kajihara (J. Electron. Test., 2003)