Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis. - Bing-Han Hsieh; Yun-Sheng Liu; James Chien-Mo Li; Chris Nigh; Mason Chern; Gaurav Bhargava (ITC, 2023)

ML-based Adaptive Wafer Sort to Preserve Diagnostic Information. - Yun-Sheng Liu; Min-Hsin Liu; James Chien-Mo Li (VTS, 2025)