Constructing a Metrology Sampling Framework for In-line Inspection in Semiconductor Fabrication. - Chen-Fu Chien 001; Yun-Siang Lin; Yu-Shin Tan (APMS (2), 2018)

Deep reinforcement learning for selecting demand forecast models to empower Industry 3.5 and an empirical study for a semiconductor component distributor. - Chen-Fu Chien 001; Yun-Siang Lin; Sheng-Kai Lin (Int. J. Prod. Res., 2020)