Effect of trench edge on pMOSFET reliability. - Yung-Huei Lee; Tom Linton; Ken Wu; Neal R. Mielke (Microelectron. Reliab., 2001)

The impact of PMOST bias-temperature degradation on logic circuit reliability performance. - Yung-Huei Lee; Steve Jacobs; Stefan Stadler; Neal R. Mielke; Ramez Nachman (Microelectron. Reliab., 2005)

Robust Inductor Design for RF Circuits. - Yin-Lung Ryan Lu; Yung-Huei Lee; William J. Mcmahon; Tze-Ching Fung (CICC, 2006)

Study of dynamic TDDB in scaled FinFET technologies. - Kaustubh Joshi 003; Shu-Wen Chang; D. S. Huang; P. J. Liao; Yung-Huei Lee (IRPS, 2018)

Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability. - Subhadeep Mukhopadhyay 002; Yung-Huei Lee; Jen-Hao Lee (Microelectron. Reliab., 2018)

A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates. - Kaustubh Joshi 003; Yung-Huei Lee; Yu-Cheng Yao; Shu-Wen Chang; Siao-Syong Bian; P. J. Liao; Jiaw-Ren Shih; Min-Jan Chen (IRPS, 2019)

Time-Efficient Characterization of Time-Dependent Gate Oxide Breakdwon Using Tunable Ramp Voltage Stress (TRVS) Method for Automotive Applications. - Shih-che Hung; Shih-Chang Chen; Pei-Shan Chien; Yu-Sheng Cho; Yung-Huei Lee; Wei-Shuo Hung (IRPS, 2021)

Composition Segregation of Ge-Rich GST and Its Effect on Reliability. - Yung-Huei Lee; P. J. Liao; Vincent Hou; Dawei Heh; Chih-Hung Nien; Wen-Hsien Kuo; Gary T. Chen; Shao-Ming Yu; Yu-Sheng Chen; Jau-Yi Wu; Xinyu Bao; Carlos H. Diaz (IRPS, 2021)