An Intelligent Software-Integrated Environment of IC Testing. - Yuning Sun; Xiaoming Wang; Wanchun Shi (ITC, 1994)

ICTSSE: An object-oriented IC test software supporting environment. - Yuning Sun; Xiaoming Wang; Wanchun Shi (J. Comput. Sci. Technol., 1995)

SEW: Self-calibration Enhanced Whole Slide Pathology Image Analysis. - Haoming Luo; Xiaotian Yu; Shengxuming Zhang; Jiabin Xia; Yang Jian; Yuning Sun; Liang Xue; Mingli Song; Jing Zhang 037; Xiuming Zhang; Zunlei Feng (CoRR, 2024)