Mixed Pattern Recognition Methodology on Wafer Maps with Pre-trained Convolutional Neural Networks. - Yunseon Byun; Jun-Geol Baek (ICAART (2), 2020)

Image Synthesis with Single-type Patterns for Mixed-type Pattern Recognition on Wafer Bin Maps. - Yunseon Byun; Jun-Geol Baek (ICAIIC, 2022)

Time Series Anomaly Detection Using Contrastive Learning based One-Class Classification. - Yeseul Lee; Yunseon Byun; Jun-Geol Baek (ICAIIC, 2023)

Decomposed Degradation Pattern Alignment for Domain Adaptation in Machine Remaining Useful Life Prediction. - Byoung-Mo Koo; Yunseon Byun; Jun-Geol Baek (ICAIIC, 2025)

Memory augmented coherent probabilistic forecasts for hierarchically related time series. - Junyong Lee; Yunseon Byun; Byoung-Mo Koo; Jun-Geol Baek (Neurocomputing, 2025)

Unsupervised fault detection using frequency-wise angular filtering in contaminated vibration signals. - Yunseon Byun; Daeju Maeng; Jun-Geol Baek (Int. J. Prod. Res., 2025)