Machinery Fault Diagnosis Based on Domain Adaptation to Bridge the Gap Between Simulation and Measured Signals. - Yunxia Lou; Anil Kumar 005; Jiawei Xiang (IEEE Trans. Instrum. Meas., 2022)

Semi-supervised dual-constraint centroid contrastive prototypical network for flip chip defect detection under limited labeled data. - Yunxia Lou; Lei Su 002; Jiefei Gu; Xinwei Zhao; Ke Li 038; Michael G. Pecht (Eng. Appl. Artif. Intell., 2025)