Atomic visualization of the emergence of orthorhombic phase in Hf0.5Zr0.5O2 ferroelectric film with in-situ rapid thermal annealing. - Tianjiao Xin; Yonghui Zheng; Yan Cheng; Kai Du; Yiwei Wang; Zhaomeng Gao; Diqing Su; Yunzhe Zheng; Qilan Zhong; Cheng Liu; Rong Huang; Chungang Duan; et al. (VLSI Technology and Circuits, 2022)

Reversible and Irreversible Polarization Degradation of Hf0.5Zr0.5O2 Capacitors with Coherent Structural Transition at Elevated Temperatures. - Zhaomeng Gao; Tianjiao Xin; Cheng Liu; Yilin Xu; Yiwei Wang; Yunzhe Zheng; Rui Wang; Xiaotian Li; Yonghui Zheng; Kai Du; Diqing Su; Zhaohao Zhang; et al. (IRPS, 2024)

Polar Axis Orientation Control of Hafnium-Based Ferroelectric Capacitors with in-Situ AC Electric Bias During Rapid Thermal Annealing. - Zhaomeng Gao; Tianjiao Xin; D. Kai; Qiwendong Zhao; Yiwei Wang; Cheng Liu; Yilin Xu; Rui Wang; Guangjie Shi; Yunzhe Zheng; Yonghui Zheng; Yan Cheng; et al. (VLSI Technology and Circuits, 2024)