Efficient Full-Chip Yield Analysis Methodology for OPC-Corrected VLSI Designs. - Valery Axelrad; Nicolas B. Cobb; M. O'Brien; Thuy Do; Tom Donnelly; Yuri Granik; Emile Y. Sahouria; Victor Boksha; Artur Balasinski (ISQED, 2000)

Overview and development of EDA tools for integration of DSA into patterning solutions. - J. Andres Torres; Germain Fenger; Daman Khaira; Yuansheng Ma; Yuri Granik; Chris Kapral; Joydeep Mitra; Polina Krasnova; Dehia Ait-Ferhat (ISQED, 2017)