March PS(23N) Test for DRAM Pattern-Sensitive Faults. - Vyacheslav N. Yarmolik; Yuri V. Klimets; Serge N. Demidenko (Asian Test Symposium, 1998)

Error Detecting Refreshment for Embedded DRAMs. - Sybille Hellebrand; Hans-Joachim Wunderlich; Alexander A. Ivaniuk; Yuri V. Klimets; Vyacheslav N. Yarmolik (VTS, 1999)

Efficient Online and Offline Testing of Embedded DRAMs. - Sybille Hellebrand; Hans-Joachim Wunderlich; Alexander A. Ivaniuk; Yuri V. Klimets; Vyacheslav N. Yarmolik (IEEE Trans. Computers, 2002)