Defects Detection by Approximation, Multilevel Segmentation and Comparison of Samples. - Roman Melnyk; Ruslan Tushnytskyy; Yurii Havrylko (CSIT (1), 2020)

Fabric Defects Detection by Comparison of Clustered Samples. - Roman Melnyk; Yurii Havrylko; Ivan Mykulanynets (DSMP, 2020)

Surface Defects Detection by Clustering and Rotating Image Analysis. - Roman Melnyk; Ruslan Tushnytskyy; Yurii Havrylko (DSMP, 2020)