Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP. - Vladimir Chepelev; Yury Parfenov; William Radasky; Boris Titov; Leonid Zdoukhov; Kejie Li; Yuhao Chen; Xu Kong; Yan-zhao Xie (J. Electron. Test., 2018)

Role of the Pulse Repetition Rate when Assessing Electromagnetic Immunity of Electronic Devices. - Yury Parfenov; Vladimir Chepelev; Yuhao Chen; Yan-zhao Xie (J. Electron. Test., 2020)

Integral Neural Networks. - Kirill Solodskikh; Azim Kurbanov; Ruslan Aydarkhanov; Irina Zhelavskaya; Yury Parfenov; Dehua Song; Stamatios Lefkimmiatis (CVPR, 2023)