Observations of Supply-Voltage-Noise Dispersion in Sub-nsec. - Kan Takeuchi; Genichi Tanaka; Hiroaki Matsushita; Kenichi Yoshizumi; Yusaku Katsuki; Takao Sato (ITC, 2008)

Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations. - Kan Takeuchi; Atsushi Yoshikawa 003; Michio Komoda; Ken Kotani; Hiroaki Matsushita; Yusaku Katsuki; YuyoYamamoto; Takao Sato (IEEE Trans. Very Large Scale Integr. Syst., 2008)

Spatial Distribution Measurement of Dynamic Voltage Drop Caused by Pulse and Periodic Injection of Spot Noise. - Kan Takeuchi; Masaki Shimada; Takao Sato; Yusaku Katsuki; Hiroumi Yoshikawa; Hiroaki Matsushita (IEEE Trans. Very Large Scale Integr. Syst., 2013)