Trap Dynamic Detection of GaN HEMT under Repetitive Short Circuit Degradation. - Wenjuan Mei; Chaowu Pan; Zhen Liu 003; Yuanzhang Su; Yusong Mei; Qi Zhou (I2MTC, 2023)

Mixture test strategy optimization for analog systems. - Wenjuan Mei; Zhen Liu 003; Ouhang Li; Yuanzhang Su; Yusong Mei; Yongji Long (Frontiers Inf. Technol. Electron. Eng., 2023)