Parasitic Effects in Multi-Gate MOSFETs. - Yusuke Kobayashi 002; C. Raghunathan Manoj; Kazuo Tsutsui; Venkanarayan Hariharan; Kuniyuki Kakushima; V. Ramgopal Rao; Parhat Ahmet; Hiroshi Iwai (IEICE Trans. Electron., 2007)

Analysis of dependence of short-channel effects in double-gate MOSFETs on channel thickness. - Yusuke Kobayashi 002; Kuniyuki Kakushima; Parhat Ahmet; V. Ramgopal Rao; Kazuo Tsutsui; Hiroshi Iwai (Microelectron. Reliab., 2010)