A Design for Testability Method for k-Cycle Capture Test Generation. - Yuta Ishiyama; Toshinori Hosokawa; Hiroshi Yamazaki (IOLTS, 2019)

A Test Sensitization State Compaction Method on Controller Augmentation. - Yuki Ikegaya; Toshinori Hosokawa; Yuta Ishiyama; Hiroshi Yamazaki (IOLTS, 2020)