A method for determining differential life test scheme for space components. - Xiujuan Zhao; Guicui Fu; Yutai Su (IECON, 2017)

Life prediction methodology of system-in-package based on physics of failure. - Guicui Fu; Yutai Su; Wendi Guo; Bo Wan; Zhongqing Zhang; Ye Wang (Microelectron. Reliab., 2018)

Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle. - Bo Wan; Ye Wang; Yutai Su; Guicui Fu (IEEE Access, 2020)

PRNU Estimation of Linear CMOS Image Sensors That Allows Nonuniform Illumination. - Ye Wang; Bo Wan; Guicui Fu; Yutai Su (IEEE Trans. Instrum. Meas., 2021)

Virtual metrology in semiconductor manufacturing: Current status and future prospects. - Varad Maitra; Yutai Su; Jing Shi 006 (Expert Syst. Appl., 2024)