Defect Diagnosis - Reasoning Methodology. - Yasuo Sato; Kazushi Sugiura; Reisuke Shimoda; Yutaka Yoshizawa; Kenji Norimatsu; Masaru Sanada (ATS, 2006)

Fault diagnosis technology based on transistor behavior analysis for physical analysis. - Masaru Sanada; Yutaka Yoshizawa (Microelectron. Reliab., 2006)