A practical yield prediction approach using inline defect metrology data for system-on-chip integrated circuits. - Yuting Kong; Dong Ni 002 (CASE, 2017)

SDNet: mutil-branch for single image deraining using swin. - Fuxiang Tan; Yuting Kong; Yingying Fan; Feng Liu; Daxin Zhou; Hao Zhang; Long Chen; Liang Gao 011; Yurong Qian (CoRR, 2021)

TransR*: Representation learning model by flexible translation and relation matrix projection. - Zhenghang Zhang; Jinlu Jia; Yalin Wan; Yang Zhou; Yuting Kong; Yurong Qian; Jun Long (J. Intell. Fuzzy Syst., 2021)

DBSwin: Transformer based dual branch network for single image deraining. - Fuxiang Tan; Yurong Qian; Yuting Kong; Hao Zhang; Daxin Zhou; Yingying Fan; Long Chen; Zhengqing Xiao (J. Intell. Fuzzy Syst., 2022)

Research on Recommendation Algorithm Based on TrustSVD++ and Deep Matrix Decomposition. - Gongjin Chen; Yuting Kong; Yantao He (EITCE, 2024)

Correlation analysis of sampled wafer profile maps based on a deep reconstruction model. - Yuting Kong; Dong Ni 002 (Appl. Soft Comput., 2024)

General convergence results of the modulus-based methods for vertical nonlinear complementarity problems. - Yuting Kong; Xiaoping Lu; Hua Zheng (Comput. Appl. Math., 2024)

Enhancing trading strategies by combining incremental reinforcement learning and self-supervised prediction. - Chujin Zhou; Yuling Huang; Yuting Kong; Xiaoping Lu (Expert Syst. Appl., 2025)