Enhanced Interconnect Test Method for Resistive Open Defects in Final Tests with Relaxation Oscillators. - Masao Ohmatsu; Yuto Ohtera; Yuki Ikiri; Hiroyuki Yotsuyanagi; Shyue-Kung Lu; Masaki Hashizume (ATS, 2022)

Detectability of Resistive Open Defects with Analog Relaxation Oscillators Under Unit-to-Unit Variations of Dies. - Yuya Yamahashi; Yuto Ohtera; Hiroyuki Yotsuyanagi; Shyue-Kung Lu; Masaki Hashizume (3DIC, 2024)