Soft-Error Tolerance Depending on Supply Voltage by Heavy Ions on Radiation-Hardened Flip Flops in a 65 nm Bulk Process. - Yuto Tsukita; Mitsunori Ebara; Jun Furuta; Kazutoshi Kobayashi (ASICON, 2019)

Impact of Combinational Logic Delay for Single Event Upset on Flip Flops in a 65 nm FDSOI Process. - Jun Furuta; Yuto Tsukita; Kodai Yamada; Mitsunori Ebara; Kentaro Kojima; Kazutoshi Kobayashi (IRPS, 2019)