Automated defect identification via path analysis-based features with transfer learning. - Yuwei Zhang 003; Dahai Jin; Ying Xing; Yunzhan Gong (J. Syst. Softw., 2020)

A variable-level automated defect identification model based on machine learning. - Yuwei Zhang 003; Ying Xing; Yunzhan Gong; Dahai Jin; Honghui Li; Feng Liu (Soft Comput., 2020)

ST-TLF: Cross-version defect prediction framework based transfer learning. - Yanyang Zhao; Yawen Wang; Yuwei Zhang 003; Dalin Zhang 003; Yunzhan Gong; Dahai Jin (Inf. Softw. Technol., 2022)

Cross-project defect prediction based on G-LSTM model. - Ying Xing; Xiaomeng Qian; Yu Guan; Bin Yang 038; Yuwei Zhang 003 (Pattern Recognit. Lett., 2022)

Vulnerability Name Prediction Based on Enhanced Multi-Source Domain Adaptation. - Ying Xing; Mengci Zhao; Bin Yang 038; Yuwei Zhang 003; Wenjin Li; Jiawei Gu; Jun Yuan; Lexi Xu (TrustCom, 2023)

Neural Program Repair with Program Dependence Analysis and Effective Filter Mechanism. - Yuwei Zhang 003; Ge Li 001; Zhi Jin; Ying Xing (CoRR, 2023)

SAGA: Summarization-Guided Assert Statement Generation. - Yuwei Zhang 003; Zhi Jin; Zejun Wang; Ying Xing; Ge Li 001 (CoRR, 2023)

Automated Static Warning Identification via Path-based Semantic Representation. - Yuwei Zhang 003; Ying Xing; Ge Li 001; Zhi Jin (CoRR, 2023)

STEAM: Simulating the InTeractive BEhavior of ProgrAMmers for Automatic Bug Fixing. - Yuwei Zhang 003; Zhi Jin; Ying Xing; Ge Li 001 (CoRR, 2023)

Defect Category Prediction Based on Multi-Source Domain Adaptation. - Ying Xing; Mengci Zhao; Bin Yang 038; Yuwei Zhang 003; Wenjin Li; Jiawei Gu; Jun Yuan (CoRR, 2024)

PATCH: Empowering Large Language Model with Programmer-Intent Guidance and Collaborative-Behavior Simulation for Automatic Bug Fixing. - Yuwei Zhang 003; Zhi Jin; Ying Xing; Ge Li 001; Fang Liu 032; Jiaxin Zhu; Wensheng Dou; Jun Wei 001 (CoRR, 2025)

CITYWALK: Enhancing LLM-Based C++ Unit Test Generation via Project-Dependency Awareness and Language-Specific Knowledge. - Yuwei Zhang 003; Qingyuan Lu; Kai Liu; Wensheng Dou; Jiaxin Zhu; Li Qian; Chunxi Zhang; Zheng Lin; Jun Wei 001 (CoRR, 2025)

SAGA: Summarization-Guided Assert Statement Generation. - Yuwei Zhang 003; Zhi Jin; Ze-Jun Wang; Ying Xing; Ge Li 001 (J. Comput. Sci. Technol., 2025)